Keithley NVM AppNote free download

File name NVM_AppNote.pdf

Number 3141 Pulse I-V Characterization of Application Note Non-Volatile Memory Technologies Series Introduction testing floating gate flash, phase-change cell, and ferro-electric cell devices. Until recently, floating gate (FG) NAND flash memory technology has successfully met the growing requirement for non-volatile memory (NVM) for digital cameras, MP3 players Brief History of NVM and smartphones. However, there is increasing concern in the Scientists around the world are investigating NVM alternatives consumer electronics industry that floating gate NVM may not that can replace FG NAND technology, including phase-change be able to continue providing higher storage capacities at the memory (PCM/PRAM), charge trap flash (CTF/SONOS), resistive ever-lower cost-per-bit requirements that drive the NVM market memory (ReRAM), ferro-electric memory (FeRAM), and [1]. The potential for the floating gate approach to "hit the wall" magnetoresistive memory (MRAM) (Figure 1). These device means that research into alternative technologies has become technologies have been studied for years, and each is currently increasingly critical. available in the market in some form. Other NVM technologies, This wide-ranging research into an expanding number including spin-transfer torque (STT) MRAM, floating body of materials and technologies requires an electrical test (FBRAM), and various types of carbon-nanotube-based memory system with wide dynamic range and flexible parameter (CNT RAM), are being actively researched to determine their control. This application note provides a brief history of NVM, suitability for memory product applications. an overview of the test parameters required for electrical In addition to the traditional uses of NVM in portable characterization of NVM materials and devices, and an consumer electronic devices, the success of FG NVM has created explanation of the capabilities of the Model 4225-PMU Ultra-Fast new product categories, such the ubiquitous "thumb" or USB I-V Module with the Model 4225-RPM Remote Amplifier/Switch, drive and, more recently, the high performance Solid State Disk two instrument options designed for use with Keithley's Model (SSD) products now being used as replacements for traditional 4200-SCS Semiconductor Characterization System. The Model computer hard drives in high performance applications. These 4225-PMU/4225-RPM combinat